Explainable Feature Embedding using Convolutional Neural Networks for Pathological Image Analysis

Kazuki Uehara, Masahiro Murakawa, Hirokazu Nosato, Hidenori Sakanashi. Explainable Feature Embedding using Convolutional Neural Networks for Pathological Image Analysis. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 4560-4565, IEEE, 2020. [doi]

Authors

Kazuki Uehara

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Masahiro Murakawa

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Hirokazu Nosato

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Hidenori Sakanashi

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