Kazuki Uehara, Masahiro Murakawa, Hirokazu Nosato, Hidenori Sakanashi. Explainable Feature Embedding using Convolutional Neural Networks for Pathological Image Analysis. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 4560-4565, IEEE, 2020. [doi]
Abstract is missing.