Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae. Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 1, IEEE, 2018. [doi]
@inproceedings{UemuraLMMLLSP18,
title = {Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit},
author = {Taiki Uemura and Soonyoung Lee and Dahye Min and Ihlhwa Moon and Jungman Lim and Seungbae Lee and Hyun-Chul Sagong and Sangwoo Pae},
year = {2018},
doi = {10.1109/IRPS.2018.8353689},
url = {https://doi.org/10.1109/IRPS.2018.8353689},
researchr = {https://researchr.org/publication/UemuraLMMLLSP18},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}