CMOS Smart Sensor for Monitoring the Quality of Perishables

Ken Ueno, Tetsuya Hirose, Tetsuya Asai, Yoshihito Amemiya. CMOS Smart Sensor for Monitoring the Quality of Perishables. J. Solid-State Circuits, 42(4):798-803, 2007. [doi]

@article{UenoHAA07-0,
  title = {CMOS Smart Sensor for Monitoring the Quality of Perishables},
  author = {Ken Ueno and Tetsuya Hirose and Tetsuya Asai and Yoshihito Amemiya},
  year = {2007},
  doi = {10.1109/JSSC.2007.891676},
  url = {https://doi.org/10.1109/JSSC.2007.891676},
  researchr = {https://researchr.org/publication/UenoHAA07-0},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {42},
  number = {4},
  pages = {798-803},
}