Hiroshi Ueno, Seiji Ishikawa, Yoshinori Otsuka, Kiyoshi Kato. Automatic Spinal Deformity Detection by Two Characteristic Axes. In Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1996, November 12-14, 1996, Tokyo, Japan. pages 47-50, 1996. [doi]
Abstract is missing.