Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato. Path clustering for adaptive test. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 15-20, IEEE Computer Society, 2010. [doi]
Abstract is missing.