Jörg Uffen, Michael H. Breitner. Management of Technical Security Measures: An Empirical Examination of Personality Traits and Behavioral Intentions. In 46th Hawaii International Conference on System Sciences, HICSS 2013, Wailea, HI, USA, January 7-10, 2013. pages 4551-4560, IEEE, 2013. [doi]
Abstract is missing.