Enes Ugur, Chi Xu, Fei Yang 0006, Shi Pu, Bilal Akin. A New Complete Condition Monitoring Method for SiC Power MOSFETs. IEEE Transactions on Industrial Electronics, 68(2):1654-1664, 2021. [doi]
@article{UgurXYPA21,
title = {A New Complete Condition Monitoring Method for SiC Power MOSFETs},
author = {Enes Ugur and Chi Xu and Fei Yang 0006 and Shi Pu and Bilal Akin},
year = {2021},
doi = {10.1109/TIE.2020.2970668},
url = {https://doi.org/10.1109/TIE.2020.2970668},
researchr = {https://researchr.org/publication/UgurXYPA21},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {68},
number = {2},
pages = {1654-1664},
}