A New Complete Condition Monitoring Method for SiC Power MOSFETs

Enes Ugur, Chi Xu, Fei Yang 0006, Shi Pu, Bilal Akin. A New Complete Condition Monitoring Method for SiC Power MOSFETs. IEEE Transactions on Industrial Electronics, 68(2):1654-1664, 2021. [doi]

Abstract

Abstract is missing.