Markus Ulbricht, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus. A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 143-146, IEEE, 2011. [doi]
Abstract is missing.