Najeeb Ullah, Maurizio Morisio, Antonio Vetro. A Comparative Analysis of Software Reliability Growth Models using Defects Data of Closed and Open Source Software. In Jonathan P. Bowen, Huibiao Zhu, Mike Hinchey, editors, 35th Annual IEEE Software Engineering Workshop, SEW 2012, Heraclion, Crete, Greece, October 12-13, 2012. pages 187-192, IEEE Computer Society, 2012. [doi]
Abstract is missing.