Ganesan Umanesan, Eiji Fujiwara. Single Byte Error Control Codes with Double Bit within a Block Error Correcting Capability for Semiconductor Memory Systems. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 192-200, IEEE Computer Society, 2000. [doi]
Abstract is missing.