Katsuyuki Umezawa, Tomohiko Saito, Takashi Ishida, Makoto Nakazawa, Shigeichi Hirasawa. An Electroencephalograph-Based Method for Judging the Difficulty of a Task Given to a Learner. In Maiga Chang, Nian-Shing Chen, Ronghuai Huang, Kinshuk, Demetrios G. Sampson, Radu Vasiu, editors, 17th IEEE International Conference on Advanced Learning Technologies, ICALT 2017, Timisoara, Romania, July 3-7, 2017. pages 384-386, IEEE, 2017. [doi]
@inproceedings{UmezawaSINH17,
title = {An Electroencephalograph-Based Method for Judging the Difficulty of a Task Given to a Learner},
author = {Katsuyuki Umezawa and Tomohiko Saito and Takashi Ishida and Makoto Nakazawa and Shigeichi Hirasawa},
year = {2017},
doi = {10.1109/ICALT.2017.18},
url = {https://doi.org/10.1109/ICALT.2017.18},
researchr = {https://researchr.org/publication/UmezawaSINH17},
cites = {0},
citedby = {0},
pages = {384-386},
booktitle = {17th IEEE International Conference on Advanced Learning Technologies, ICALT 2017, Timisoara, Romania, July 3-7, 2017},
editor = {Maiga Chang and Nian-Shing Chen and Ronghuai Huang and Kinshuk and Demetrios G. Sampson and Radu Vasiu},
publisher = {IEEE},
isbn = {978-1-5386-3870-5},
}