Jayakrishnan Unnikrishnan, Venugopal V. Veeravalli, Sean P. Meyn. Least favorable distributions for robust quickest change detection. In IEEE International Symposium on Information Theory, ISIT 2009, June 28 - July 3, 2009, Seoul, Korea, Proceedings. pages 649-653, IEEE, 2009. [doi]
Abstract is missing.