On-chip test generation for combinational circuits by LFSR modification - researchr publication authors

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Shambhu J. Upadhyaya, Liang-Chi Chen. On-chip test generation for combinational circuits by LFSR modification. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 84-87, IEEE Computer Society, 1993. [doi]

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