Prasanti Uppaluri, Uwe Sparmann, Irith Pomeranz. On minimizing the number of test points needed to achieve complete robust path delay fault testability. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 288-295, IEEE Computer Society, 1996. [doi]
@inproceedings{UppaluriSP96,
title = {On minimizing the number of test points needed to achieve complete robust path delay fault testability},
author = {Prasanti Uppaluri and Uwe Sparmann and Irith Pomeranz},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040288abs.htm},
tags = {completeness, testing},
researchr = {https://researchr.org/publication/UppaluriSP96},
cites = {0},
citedby = {0},
pages = {288-295},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}