Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy - researchr publication authors

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Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto, Futoshi Iwata. Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy. In International Symposium on Micro-NanoMechatronics and Human Science, MHS 2018, Nagoya, Japan, December 9-12, 2018. pages 1-4, IEEE, 2018. [doi]

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