Masanori Usui, Hidehiko Kimura, Toshikazu Satoh, Takashi Asada, Satoshi Yamaguchi, Masashi Kato. Degradation of a sintered Cu nanoparticle layer studied by synchrotron radiation computed laminography. Microelectronics Reliability, 63:152-158, 2016. [doi]
Abstract is missing.