Noise-induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-varying Resistor

Yoko Uwate, Yoshifumi Nishio, Ruedi Stoop. Noise-induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-varying Resistor. In International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan. pages 1887-1890, IEEE, 2009. [doi]

@inproceedings{UwateNS09-0,
  title = {Noise-induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-varying Resistor},
  author = {Yoko Uwate and Yoshifumi Nishio and Ruedi Stoop},
  year = {2009},
  doi = {10.1109/ISCAS.2009.5118148},
  url = {http://dx.doi.org/10.1109/ISCAS.2009.5118148},
  researchr = {https://researchr.org/publication/UwateNS09-0},
  cites = {0},
  citedby = {0},
  pages = {1887-1890},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan},
  publisher = {IEEE},
}