Noise-induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-varying Resistor

Yoko Uwate, Yoshifumi Nishio, Ruedi Stoop. Noise-induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-varying Resistor. In International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan. pages 1887-1890, IEEE, 2009. [doi]

Abstract

Abstract is missing.