Slawosz Uznanski, Benjamin Todd, Johannes Walter, Andrea Vilar-Villanueva. COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches. In Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2014, Lviv, Ukraine, June 19-21, 2014. pages 381-384, IEEE, 2014. [doi]
Abstract is missing.