Anis Uzzaman. How To Increase the Effectiveness of Yield Diagnostics-Is DFM the Answer to This?. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 221, IEEE Computer Society, 2008. [doi]
@inproceedings{Uzzaman08,
title = {How To Increase the Effectiveness of Yield Diagnostics-Is DFM the Answer to This?},
author = {Anis Uzzaman},
year = {2008},
doi = {10.1109/ATS.2008.95},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.95},
researchr = {https://researchr.org/publication/Uzzaman08},
cites = {0},
citedby = {0},
pages = {221},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}