Iago Vaamonde, Antón García-Díaz. Accurate, high speed, and robust inspection enabled by salient landmarks. In Antoni Grau, Herminio Martínez, editors, Proceedings of the 2014 IEEE Emerging Technology and Factory Automation, ETFA 2014, Barcelona, Spain, September 16-19, 2014. pages 1-7, IEEE, 2014. [doi]
Abstract is missing.