Swathi Vadde, Subramaniam Ganesan. Effect of fault in single load distribution with FIFO(first in, first out) back propagation of results. In 2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, ND, USA, May 19-21, 2016. pages 804-810, IEEE, 2016. [doi]
Abstract is missing.