George Vakanas, Björn Vandecasteele, David Schaubroek, Joke De Messemaeker, Geert Willems, Mark Ashworth, Geoffrey D. Wilcox, Ingrid De Wolf. Sn whisker evaluations in 3D microbumped structures. Microelectronics Reliability, 54(9-10):1982-1987, 2014. [doi]
Abstract is missing.