Timing error tolerance in nanometer ICs

S. Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni. Timing error tolerance in nanometer ICs. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 283-288, IEEE, 2010. [doi]

Abstract

Abstract is missing.