In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM)

Renuka Vallabhaneni, Ehsan Izadi, Carl R. Mayer, C. Shashank Kaira, Sudhanshu S. Singh, Jagannathan Rajagopalan, Nikhilesh Chawla. In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM). Microelectronics Reliability, 79:314-320, 2017. [doi]

Abstract

Abstract is missing.