Antonio Vallejo Jr., Juan Arturo Nolazco-Flores, Rubén Morales-Menéndez, Luis Enrique Sucar, Ciro A. Rodríguez. Tool-Wear Monitoring Based on Continuous Hidden Markov Models. In Alberto Sanfeliu, Manuel Lazo-Cortés, editors, Progress in Pattern Recognition, Image Analysis and Applications, 10th Iberoamerican Congress on Pattern Recognition, CIARP 2005, Havana, Cuba, November 15-18, 2005, Proceedings. Volume 3773 of Lecture Notes in Computer Science, pages 880-890, Springer, 2005. [doi]
Abstract is missing.