Prospects of 2D Junctionless Channel Transistor (JLCT) Towards Analog and RF Metrics Using Si and SiGe in Device Layer

B. Vandana, S. K. Mohapatra, J. K. Das, B. S. Patro. Prospects of 2D Junctionless Channel Transistor (JLCT) Towards Analog and RF Metrics Using Si and SiGe in Device Layer. J. Low Power Electronics, 13(3):536-544, 2017. [doi]

Abstract

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