Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis - researchr publication authors

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Pierre Vanhauwaert, Régis Leveugle, Philippe Roche. Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis. In IFIP VLSI-SoC 2006, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Nice, France, 16-18 October 2006. pages 391-396, IEEE, 2006. [doi]

This author has not been identified. Look up 'Pierre Vanhauwaert' in GoogleThis author has not been identified. Look up 'Régis Leveugle' in GoogleThis author has not been identified. Look up 'Philippe Roche' in Google

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