Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis

Pierre Vanhauwaert, RĂ©gis Leveugle, Philippe Roche. Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis. In IFIP VLSI-SoC 2006, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Nice, France, 16-18 October 2006. pages 391-396, IEEE, 2006. [doi]

Abstract

Abstract is missing.