Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan F. M. Van Impe. The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares. In Petra Perner, editor, Advances in Data Mining. Applications and Theoretical Aspects - 12th Industrial Conference, ICDM 2012, Berlin, Germany, July 13-20, 2012. Proceedings. Volume 7377 of Lecture Notes in Computer Science, pages 121-135, Springer, 2012. [doi]
@inproceedings{VanlaerKGI12,
title = {The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares},
author = {Jef Vanlaer and Pieter Van den Kerkhof and Geert Gins and Jan F. M. Van Impe},
year = {2012},
doi = {10.1007/978-3-642-31488-9_11},
url = {http://dx.doi.org/10.1007/978-3-642-31488-9_11},
researchr = {https://researchr.org/publication/VanlaerKGI12},
cites = {0},
citedby = {0},
pages = {121-135},
booktitle = {Advances in Data Mining. Applications and Theoretical Aspects - 12th Industrial Conference, ICDM 2012, Berlin, Germany, July 13-20, 2012. Proceedings},
editor = {Petra Perner},
volume = {7377},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-31487-2},
}