Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan F. M. Van Impe. The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares. In Petra Perner, editor, Advances in Data Mining. Applications and Theoretical Aspects - 12th Industrial Conference, ICDM 2012, Berlin, Germany, July 13-20, 2012. Proceedings. Volume 7377 of Lecture Notes in Computer Science, pages 121-135, Springer, 2012. [doi]
Abstract is missing.