Maí C. R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner. On the output events in concurrent error detection schemes. In 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, St. Julien's, Malta, August 31 2008-September 3, 2008. pages 978-981, IEEE, 2008. [doi]
Abstract is missing.