Relevant metrics for evaluation of concurrent error detection schemes

Maí C. R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner. Relevant metrics for evaluation of concurrent error detection schemes. Microelectronics Reliability, 48(8-9):1601-1603, 2008. [doi]

Authors

Maí C. R. de Vasconcelos

This author has not been identified. Look up 'Maí C. R. de Vasconcelos' in Google

Denis Teixeira Franco

This author has not been identified. Look up 'Denis Teixeira Franco' in Google

Lirida A. B. Naviner

This author has not been identified. Look up 'Lirida A. B. Naviner' in Google

Jean-François Naviner

This author has not been identified. Look up 'Jean-François Naviner' in Google