Maí C. R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner. Relevant metrics for evaluation of concurrent error detection schemes. Microelectronics Reliability, 48(8-9):1601-1603, 2008. [doi]
@article{VasconcelosFNN08,
title = {Relevant metrics for evaluation of concurrent error detection schemes},
author = {Maí C. R. de Vasconcelos and Denis Teixeira Franco and Lirida A. B. Naviner and Jean-François Naviner},
year = {2008},
doi = {10.1016/j.microrel.2008.07.016},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.016},
tags = {C++},
researchr = {https://researchr.org/publication/VasconcelosFNN08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1601-1603},
}