Maria Vasileiou, George Papageorgiou, Christos Tjortjis. A Machine Learning Approach for Effective Software Defect Detection. In Nikolaos G. Bourbakis, George A. Tsihrintzis, Maria Virvou, editors, 14th International Conference on Information, Intelligence, Systems & Applications, IISA 2023, Volos, Greece, July 10-12, 2023. pages 1-8, IEEE, 2023. [doi]
Abstract is missing.