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Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation

Vassilios D. Vassios, Argirios. T. Hatzopoulos, Dimitrios K. Papakostas. Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation. In 12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023. pages 1-6, IEEE, 2023. [doi]

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Vassilios D. Vassios

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Argirios. T. Hatzopoulos

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Dimitrios K. Papakostas

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