Vassilios D. Vassios, Argirios. T. Hatzopoulos, Dimitrios K. Papakostas. Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation. In 12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{VassiosHP23,
title = {Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation},
author = {Vassilios D. Vassios and Argirios. T. Hatzopoulos and Dimitrios K. Papakostas},
year = {2023},
doi = {10.1109/MOCAST57943.2023.10176630},
url = {https://doi.org/10.1109/MOCAST57943.2023.10176630},
researchr = {https://researchr.org/publication/VassiosHP23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2107-4},
}