LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning

Bhavya Vasudeva, Puneesh Deora, Saumik Bhattacharya, Umapada Pal 0001, Sukalpa Chanda. LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning. In 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021. pages 10614-10623, IEEE, 2021. [doi]

@inproceedings{VasudevaDB0C21,
  title = {LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning},
  author = {Bhavya Vasudeva and Puneesh Deora and Saumik Bhattacharya and Umapada Pal 0001 and Sukalpa Chanda},
  year = {2021},
  doi = {10.1109/ICCV48922.2021.01046},
  url = {https://doi.org/10.1109/ICCV48922.2021.01046},
  researchr = {https://researchr.org/publication/VasudevaDB0C21},
  cites = {0},
  citedby = {0},
  pages = {10614-10623},
  booktitle = {2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-2812-5},
}