Bhavya Vasudeva, Puneesh Deora, Saumik Bhattacharya, Umapada Pal 0001, Sukalpa Chanda. LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning. In 2021 IEEE/CVF International Conference on Computer Vision, ICCV 2021, Montreal, QC, Canada, October 10-17, 2021. pages 10614-10623, IEEE, 2021. [doi]
Abstract is missing.