A Technique for Modular Design of Self-Checking Carry-Select Adder

D. P. Vasudevan, Parag K. Lala. A Technique for Modular Design of Self-Checking Carry-Select Adder. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 325-333, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.