Statistical analysis of 6T SRAM data retention voltage under process variation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Elena Ioana Vatajel, Joan Figueras. Statistical analysis of 6T SRAM data retention voltage under process variation. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 365-370, IEEE, 2011. [doi]

This author has not been identified. Look up 'Elena Ioana Vatajel' in GoogleThis author has not been identified. Look up 'Joan Figueras' in Google

runs on WebDSL