Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine. Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 39-44, IEEE, 2013. [doi]
@inproceedings{VatajeluBDGTVB13-0,
title = {Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures},
author = {Elena I. Vatajelu and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Nabil Badereddine},
year = {2013},
doi = {10.1109/DTIS.2013.6527775},
url = {http://dx.doi.org/10.1109/DTIS.2013.6527775},
researchr = {https://researchr.org/publication/VatajeluBDGTVB13-0},
cites = {0},
citedby = {0},
pages = {39-44},
booktitle = {Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE},
publisher = {IEEE},
isbn = {978-1-4673-6038-8},
}