Elena I. Vatajelu, Joan Figueras. Robustness analysis of 6T SRAMs in memory retention mode under PVT variations. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 980-985, IEEE, 2011. [doi]
@inproceedings{VatajeluF11, title = {Robustness analysis of 6T SRAMs in memory retention mode under PVT variations}, author = {Elena I. Vatajelu and Joan Figueras}, year = {2011}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763159}, researchr = {https://researchr.org/publication/VatajeluF11}, cites = {0}, citedby = {0}, pages = {980-985}, booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011}, publisher = {IEEE}, isbn = {978-1-61284-208-0}, }