Optimal ranking of test items using the Rasch model - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Divyanshu Vats, Andrew S. Lan, Christoph Studer, Richard G. Baraniuk. Optimal ranking of test items using the Rasch model. In 54th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2016, Monticello, IL, USA, September 27-30, 2016. pages 467-473, IEEE, 2016. [doi]

This author has not been identified. Look up 'Divyanshu Vats' in GoogleThis author has not been identified. Look up 'Andrew S. Lan' in GoogleThis author has not been identified. Look up 'Christoph Studer' in GoogleThis author has not been identified. Look up 'Richard G. Baraniuk' in Google

runs on WebDSL