Divyanshu Vats, Andrew S. Lan, Christoph Studer, Richard G. Baraniuk. Optimal ranking of test items using the Rasch model. In 54th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2016, Monticello, IL, USA, September 27-30, 2016. pages 467-473, IEEE, 2016. [doi]
@inproceedings{VatsLSB16,
title = {Optimal ranking of test items using the Rasch model},
author = {Divyanshu Vats and Andrew S. Lan and Christoph Studer and Richard G. Baraniuk},
year = {2016},
doi = {10.1109/ALLERTON.2016.7852268},
url = {http://dx.doi.org/10.1109/ALLERTON.2016.7852268},
researchr = {https://researchr.org/publication/VatsLSB16},
cites = {0},
citedby = {0},
pages = {467-473},
booktitle = {54th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2016, Monticello, IL, USA, September 27-30, 2016},
publisher = {IEEE},
isbn = {978-1-5090-4550-1},
}