Addressing Critical Industrial Control System Cyber Security Concerns via High Fidelity Simulation

Rayford B. Vaughn Jr., Tommy Morris. Addressing Critical Industrial Control System Cyber Security Concerns via High Fidelity Simulation. In Joseph P. Trien, Stacy J. Prowell, John R. Goodall, Robert A. Bridges, editors, Proceedings of the 11th Annual Cyber and Information Security Research Conference, CISRC 2016, Oak Ridge, TN, USA, April 5-7, 2016. ACM, 2016. [doi]

Authors

Rayford B. Vaughn Jr.

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Tommy Morris

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