Rayford B. Vaughn Jr., Tommy Morris. Addressing Critical Industrial Control System Cyber Security Concerns via High Fidelity Simulation. In Joseph P. Trien, Stacy J. Prowell, John R. Goodall, Robert A. Bridges, editors, Proceedings of the 11th Annual Cyber and Information Security Research Conference, CISRC 2016, Oak Ridge, TN, USA, April 5-7, 2016. ACM, 2016. [doi]
@inproceedings{VaughnM16,
title = {Addressing Critical Industrial Control System Cyber Security Concerns via High Fidelity Simulation},
author = {Rayford B. Vaughn Jr. and Tommy Morris},
year = {2016},
doi = {10.1145/2897795.2897819},
url = {http://doi.acm.org/10.1145/2897795.2897819},
researchr = {https://researchr.org/publication/VaughnM16},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 11th Annual Cyber and Information Security Research Conference, CISRC 2016, Oak Ridge, TN, USA, April 5-7, 2016},
editor = {Joseph P. Trien and Stacy J. Prowell and John R. Goodall and Robert A. Bridges},
publisher = {ACM},
isbn = {978-1-4503-3752-6},
}