Low-sensitivity to process variations aging sensor for automotive safety-critical applications - researchr publication authors

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Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira. Low-sensitivity to process variations aging sensor for automotive safety-critical applications. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 238-243, IEEE Computer Society, 2010. [doi]

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